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Volumn 21, Issue 7, 2009, Pages 817-823

Domain engineering for enhanced ferroelectric properties of epitaxial (001) BiFeO thin films

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL FILMS; FERROELECTRIC FILMS; FERROELECTRICITY; GROWTH (MATERIALS); SEMICONDUCTING SILICON COMPOUNDS; SINGLE CRYSTALS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

EID: 60349102967     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200800823     Document Type: Article
Times cited : (279)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.