Raman spectroscopy: Characterization of edges, defects, and the Fermi energy of graphene and sp 2 Carbons

NanoScience and Technology

Volumn 57, Issue , 2012, Pages 15-55

  Dresselhaus, M S ^a   Jorio, A ^b   Cancado L G ^b   Dresselhaus, G ^c   Saito, R ^d  

^a USA   (United States)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84866998930     PISSN: 14344904     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-3-642-22984-8__2     Document Type: Article

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