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Applied Physics Letters

Volumn 97, Issue 3, 2010, Pages

Determination of edge purity in bilayer graphene using μ-Raman spectroscopy

(5) Begliarbekov, Milan a Sul, Onejae a Kalliakos, Sokratis a Yang, Eui Hyeok a Strauf, Stefan a

a Stevens Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; FRACTIONAL COMPOSITION; INCIDENT LASER; INTENSITY DEPENDENCE; NANOELECTRONIC DEVICES; OUT OF PHASE; POLARIZATION CONTRAST; THEORETICAL PREDICTION; ZIGZAG EDGES;

GRAPHENE; NANOELECTRONICS; RAMAN SCATTERING; RAMAN SPECTROSCOPY;

POLARIZATION;

EID: 77956197044 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3464972 Document Type: Article

Times cited : (51)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.