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Applied Physics Letters

Volumn 97, Issue 5, 2010, Pages

Direct determination of the crystallographic orientation of graphene edges by atomic resolution imaging

(7) Neubeck, S a You, Y M b Ni, Z H a,b Blake, P a Shen, Z X b Geim, A K a Novoselov, K S a

a UNIVERSITY OF MANCHESTER (United Kingdom)

b NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RESOLUTION; ATOMIC-RESOLUTION IMAGING; CRYSTALLOGRAPHIC DIRECTIONS; CRYSTALLOGRAPHIC ORIENTATIONS; DIRECT DETERMINATION; HIGH RESOLUTION SCANNING TUNNELING MICROSCOPY; HONEYCOMB LATTICES; RAMAN IMAGING; SINGLE LAYER;

CRYSTAL ORIENTATION; GRAPHENE; HONEYCOMB STRUCTURES; SILICON COMPOUNDS; SILICON OXIDES; SINGLE CRYSTALS;

SCANNING TUNNELING MICROSCOPY;

EID: 77955756209 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3467468 Document Type: Article

Times cited : (79)

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