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Volumn 66, Issue 12, 2005, Pages 2295-2298

High-efficiency high-energy-resolution spectrometer for inelastic X-ray scattering

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CRYSTALLINE MATERIALS; FLUORESCENCE; GONIOMETERS; SILICON; SPECTROMETERS; X RAY ANALYSIS;

EID: 29144502206     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2005.09.069     Document Type: Conference Paper
Times cited : (7)

References (9)
  • 8
    • 0032303678 scopus 로고    scopus 로고
    • A high-resolution large-acceptance analyzer for X-ray fluorescence and Raman spectroscopy
    • American Institute of Physics New York
    • U. Bergmann, and S. Cramer A high-resolution large-acceptance analyzer for X-ray fluorescence and Raman spectroscopy AIP Conference Proceedings 3448 1998 American Institute of Physics New York pp. 198-209
    • (1998) AIP Conference Proceedings 3448
    • Bergmann, U.1    Cramer, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.