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Volumn 3448, Issue , 1998, Pages 198-209
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High-resolution large-acceptance analyzer for X-ray fluorescence and Raman spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
BACKSCATTERING;
ELECTROMAGNETIC WAVE ABSORPTION;
ELECTROMAGNETIC WAVE REFLECTION;
EMISSION SPECTROSCOPY;
FLUORESCENCE;
OPTICAL RESOLVING POWER;
RAMAN SPECTROSCOPY;
SEMICONDUCTING SILICON;
SYNCHROTRON RADIATION;
TRANSITION METALS;
X RAY SPECTROSCOPY;
BRAGG REFLECTION;
CRYSTAL OPTICS;
X RAY SPECTROMETERS;
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EID: 0032303678
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (119)
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References (43)
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