Detectivity optimization of ingaas photon emission microscope systems

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2006, Pages 315-319

  Tan, S L ^a   Yim, K H ^a   Chan, D S H ^a   Phang, J C H ^a,b   Zhou, Y ^b   Balk, L J ^b   Chua, C M ^c   Koh, L S ^c  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b SEMICAPS Corporation   (Singapore)

^c UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; FAILURE ANALYSIS; OPTIMIZATION; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SIGNAL TO NOISE RATIO; SPECTRUM ANALYSIS;

EMISSION IMAGES; PHOTON EMISSION MICROSCOPE (PEM); SPECTRAL DETECTIVITY;

INTEGRATED CIRCUIT TESTING;

EID: 34250624525     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2006.251053     Document Type: Conference Paper

References (8)

1. MR Bruce, VJ Bruce, "ABCs of Photon Emission Microscopy", Electronic Device Failure Analysis, Vol 5, No 3, pg 13-20, 2003
2. J. C. H. Phang, "Passive Localisation Techniques; Physics, Instrumentation, and Other Issues", Electronic Device Failure Analysis Magazine, Vol 5, No 4, 51-52 (2004).
3. Kolzer, C. Boil, A. Dallmann, G. Deboy, J. Otto, D. Weinmann, "Quantitative Emission Microscopy", J. Appl. Phys, 71(11), pp. 23-41, June 1992.
4. J. C. H. Phang, D. S. H. Chan, S. L. Tan, W. B. Len, K. H. Yim, L. S. Koh, C. M. Chua and L. J. Balk, "A Review of Near Infrared Photon Emission Microscopy and Spectroscopy" Proc Int. Symp. Physical & Failure Analysis of Integrated Circuits, 275-281 (2005).
5. J. D. Vincent, "Fundamentals of Infrared Detector Operation and Testing", Chapter 1-4, John Wiley and Sons, 1989.
6. E. L. Dereniak and G.D. Boreman, "Infrared Detectors and Systems", Chapter 3-6, John Wiley and Sons, 1989.
7. Sensors Unlimited Inc., The Sensitivity of Focal Plane Arrays and Cameras, Doc No 4110-0029 (2004).
8. Antoni Rogalski, "Infrared Photon Detectors", Chapter 2, SPIE Optical Engineering Press, 1995.