Characterization of nanometer-sized, mechanically exfoliated graphene on the H-passivated Si(100) surface using scanning tunneling microscopy

Nanotechnology

Volumn 19, Issue 1, 2008, Pages

  Ritter, Kyle A ^a,b   Lyding, Joseph W ^a,b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; MONOLAYERS; NANOELECTRONICS; PASSIVATION; SCANNING TUNNELING MICROSCOPY; SILICON;

GRAPHENE; MECHANICAL EXFOLIATION; ULTRAHIGH VACUUM TUNNELING SPECTROSCOPY;

GRAPHITE;

GRAPHITE;

ARTICLE; COATED PARTICLE; MATERIAL COATING; MEASUREMENT; MOLECULAR ELECTRONICS; MOLECULAR PROBE; NANOFABRICATION; PARTICLE SIZE; PRIORITY JOURNAL; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPY;

EID: 36749030727     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/01/015704     Document Type: Article

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