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Journal of Applied Physics

Volumn 112, Issue 5, 2012, Pages

Analyzing piezoresponse force microscopy for reconstruction of probed ferroelectric structures

(4) Pan, K a Liu, Y Y a Liu, Y M b Li, J Y b

a XIANGTAN UNIVERSITY (China)

b University of Washington (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARBITRARY POLARIZATION; DOMAIN CONFIGURATIONS; DOMAIN STRUCTURE; FERROELECTRIC STRUCTURE; NANO SCALE; NUMERICAL INTEGRATION SCHEME; PIEZOELECTRIC COEFFICIENT; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION DISTRIBUTIONS; SAMPLE SURFACE;

FERROELECTRICITY; PIEZOELECTRICITY;

FERROELECTRIC MATERIALS;

EID: 84866358417 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4746034 Document Type: Conference Paper

Times cited : (18)

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