Room temperature surface piezoelectricity in SrTiO3 ceramics via piezoresponse force microscopy

Applied Physics Letters

Volumn 93, Issue 22, 2008, Pages

  Kholkin, Andrei ^a   Bdikin, Igor ^a   Ostapchuk, Tetyana ^b   Petzelt, Jan ^b  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

BUILDING MATERIALS; CERAMIC MATERIALS; CRYSTAL GROWTH; CRYSTALLOGRAPHY; GRAIN BOUNDARIES; OXYGEN; OXYGEN VACANCIES; PIEZOELECTRIC DEVICES; PIEZOELECTRICITY; POLARIZATION; PYROELECTRICITY; STRONTIUM ALLOYS; SURFACE RELAXATION;

FLEXOELECTRIC COEFFICIENTS; FLEXOELECTRIC EFFECTS; GRAIN ORIENTATIONS; INDUCED POLARIZATIONS; INHOMOGENEOUS DISTRIBUTIONS; PIEZORESPONSE; PIEZORESPONSE FORCE MICROSCOPIES; POLARIZATION DIRECTIONS; POLISHED SURFACES; ROOM TEMPERATURES; STRAIN GRADIENTS;

SINGLE CRYSTALS;

EID: 57349090197     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3037220     Document Type: Article

References (21)

1. J. H. Haeni, Nature (London) 430, 758 (2004).
2. A. Vasudevarao, A. Kumar, L. Tian, J. H. Haeni, Y. L. Li, C.-J. Eklund, Q. X. Jia, R. Uecker, P. Reiche, K. M. Rabe, L. Q. Chen, D. G. Schlom, and V. Gopalan, Phys. Rev. Lett. 97, 257602 (2006).
3. P. Zubko, G. Catalan, A. Buckley, P. R. L. Welche, and J. F. Scott, Phys. Rev. Lett. 99, 167601 (2007).
4. V. L. Gurevich, Sov. Phys. Solid State 0038-5654 23, 1377 (1981); V. L. Gurevich and A. K. Tagantsev, Sov. Phys. JETP 35, 106 (1982).
5. A. L. Kholkin, V. A. Trepakov, and G. A. Smolensky, Sov. Phys. JETP 35, 124 (1982).
6. A. L. Kholkin, Ph.D. thesis, A. F. Ioffe Physico-Trechnical Institute, Leningrad, 1988.
7. W. Zhu, J. Y. Fu, N. Li, and L. E. Cross, Appl. Phys. Lett. 89, 192904 (2006).
8. N. Bickel, G. Schmidt, K. Heinz, and K. Muller, Phys. Rev. Lett. 62, 2009 (1989).
9. J. Petzelt, T. Ostapchuk, I. Gregora, I. Rychetsky S. Hoffmann-Eifert, A. V. Pronin, Y. Yuzyuk, B. P. Gorshunov, S. Kamba, V. Bovtun, J. Pokorny, M. Savinov, V. Porokhonskyy, D. Rafaja, P. Vanek, A. Almeida, M. R. Chaves, A. A. Volkov, M. Dressel, and R. Waser, Phys. Rev. B 64, 184111 (2001).
10. M. Kim, G. Duscher, N. D. Browning, K. Sohlberg, S. T. Pantelides, and S. J. Pennycook, Phys. Rev. Lett. 86, 4056 (2001).
11. J. Petzelt, T. Ostapchuk, I. Gregora, M. Savinov, D. Chvostova, J. Liu, and Z. Shen, J. Eur. Ceram. Soc. 26, 2855 (2006).
12. J. Petzelt, T. Ostapchuk, I. Gregora, P. Kuzel, J. Liu, and Z. Chen, J. Phys.: Condens. Matter 19, 196222 (2007).
13. J. Petzelt, T. Ostapchuk, I. Gregora, D. Nuzhnyy, I. Rychetsky, K. Maca, and Z. Shen, Ferroelectrics 363, 227 (2008).
14. A. L. Kholkin, S. V. Kalinin, A. Roelofs, and A. Gruverman, in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale edited. by S. Kalinin and A. Gruverman (Springer, Berlin, 2006), Vol. 1, p. 239.
15. www.inostek.com.
16. N. Pertsev, A. Petraru, I. Bdikin, D. Kiselev, and A. L. Kholkin, Nanotechnology 19, 375703 (2008).
17. G. Catalan, B. Noheda, J. McAneney, L. J. Sinnamon, and J. M. Gregg, Phys. Rev. B 72, 020102 (2005).
18. A. K. Tagantsev, Phys. Rev. B 34, 5883 (1986).
19. S. V. Kalinin and D. A. Bonnell, Phys. Rev. B 63, 125411 (2001).
20. R. Shao, M. F. Chisholm, G. Duscher, and D. A. Bonnel, Phys. Rev. Lett. 95, 197601 (2005).
21. N. D. Browning, J. P. Buban, H. O. Moltaji, S. J. Pennycook, G. Duscher, K. D. Johnson, R. P. Rodrigues, and V. P. Dravid, Appl. Phys. Lett. 74, 2638 (1999).