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Volumn 47, Issue 10, 2012, Pages 2891-2894

Properties of Cu-doped ZnO films by RF sputtering method: Thickness dependence

Author keywords

A. Thin films; B. Sputtering; C. X ray diffraction; D. Optical properties

Indexed keywords

C-AXIS ORIENTATIONS; CHEMICAL STATE; COPPER AND ZINC; CRYSTALLINITIES; CU-DOPED ZNO; GLASS SUBSTRATES; RADIO-FREQUENCY SPUTTERING; RF SPUTTERING METHOD; THICKNESS DEPENDENCE; VALENCE STATE; VISIBLE REGION; WURTZITE STRUCTURE; X-RAY DIFFRACTION SPECTROSCOPY; XPS DATA; XRD; ZNO;

EID: 84866307800     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2012.04.103     Document Type: Conference Paper
Times cited : (19)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.