Structural properties of low-temperature grown ZnO thin films determined by X-ray diffraction and X-ray absorption spectroscopy

Thin Solid Films

Volumn 519, Issue 13, 2011, Pages 4366-4370

  Yu, Chung Jong ^a   Sung, Nark Eon ^a   Lee, Han Koo ^a   Shin, Hyun Joon ^a   Yun, Young Duck ^a   Kang, Seen Woong ^a   Lee, Ik Jae ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Epitaxy; Extented X ray absorption fine structure spectroscopy; Hall effect measurement; Thin films; X ray absorption near edge structure spectroscopy; X ray diffraction; Zinc oxide

Indexed keywords

ANGLE-DEPENDENT; C-AXIS ORIENTATIONS; CRYSTALLINITIES; CRYSTALLOGRAPHIC ORIENTATIONS; DC REACTIVE SPUTTERING; EPITAXY; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; EXTENTED X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; HALL-EFFECT MEASUREMENT; LOCAL STRUCTURE; LOW SUBSTRATE TEMPERATURE; LOW-TEMPERATURE GROWN; SPECTRAL FEATURE; WURTZITE STRUCTURE; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XANES SPECTRA; XRD; ZNO FILMS; ZNO THIN FILM;

ABSORPTION; CARRIER CONCENTRATION; DIFFRACTION; EPITAXIAL FILMS; EPITAXIAL GROWTH; GALVANOMAGNETIC EFFECTS; HALL MOBILITY; METALLIC FILMS; OPTICAL FILMS; OXIDE FILMS; SUBSTRATES; X RAY ABSORPTION; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS; ZINC; ZINC OXIDE; ZINC SULFIDE;

ABSORPTION SPECTROSCOPY;

EID: 79954444199     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.02.009     Document Type: Article

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