Planar defects in ZnO thin films deposited on optical fibers and flat substrates

Journal of Materials Research

Volumn 14, Issue 5, 1999, Pages 1876-1885

  Sagalowicz, Laurent ^a   Fox, Glen R ^a,b  

^a EPFL   (Switzerland)

^b Ramtron International Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; OPTICAL FIBERS; SCANNING ELECTRON MICROSCOPY; SPUTTER DEPOSITION; STACKING FAULTS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

COLUMNAR GRAIN; PLANAR DEFECT;

THIN FILMS;

EID: 0032656785     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0252     Document Type: Article

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