SCOPUS 정보 검색 플랫폼

Volumn 245, Issue 1-4, 2005, Pages 310-315

Thickness dependence of properties of ZnO:Ga films deposited by rf magnetron sputtering

Author keywords

Electrical and optical properties; Film thickness; Magnetron sputtering; ZnO:Ga

Indexed keywords

ELECTRIC CONDUCTIVITY; GALLIUM; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; SUBSTRATES; THICKNESS MEASUREMENT; ZINC OXIDE;

ELECTRICAL AND OPTICAL PROPERTIES; FILM THICKNESS; WURTZITE; ZNO:GA;

THIN FILMS;

EID: 17044384177 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2004.10.022 Document Type: Article

Times cited : (119)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.