Barrier heights at the SnO2/Pt interface: In situ photoemission and electrical properties

Surface Science

Volumn 602, Issue 21, 2008, Pages 3246-3252

  Körber, Christoph ^a   Harvey, Steven P ^b   Mason, Thomas O ^b   Klein, Andreas ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b Northwestern University   (United States)

Author keywords

Electrical transport measurement; Photoelectron spectroscopy; Platinum; Schottky barrier; Tin oxide

Indexed keywords

ANNEALING; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC PROPERTIES; ELECTRON SPECTROSCOPY; EMISSION SPECTROSCOPY; OXYGEN; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PHOTOIONIZATION; PHOTONS; PLATINUM; SPECTRUM ANALYSIS; TIN; TITANIUM COMPOUNDS;

BARRIER HEIGHTS; CONDUCTIVITY MEASUREMENTS; ELECTRICAL; ELECTRICAL BEHAVIORS; ELECTRICAL PROPERTIES; ELECTRICAL TRANSPORT MEASUREMENT; IN VACUUMS; IN-SITU; OHMIC BEHAVIORS; OXYGEN ATMOSPHERES; POLYCRYSTALLINE; POLYCRYSTALLINE SPECIMENS; SCHOTTKY BARRIER; SCHOTTKY BARRIER HEIGHTS; SUBSEQUENT ANNEALING; VOLTAGE CHARACTERISTICS;

SCHOTTKY BARRIER DIODES;

EID: 54249086540     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.08.015     Document Type: Article

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