Glass transition in thin supported polystyrene films probed by temperature-modulated ellipsometry in vacuum

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 86, Issue 2, 2012, Pages

  Efremov, Mikhail Yu ^a   Kiyanova, Anna V ^a   Last, Julie ^a   Soofi, Shauheen S ^a   Thode, Christopher ^a   Nealey, Paul F ^a  

^a Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL FACTORS; IN-VACUUM; LINEAR TEMPERATURE; NONUNIFORMITY; POLYSTYRENE FILMS; PRE-TREATMENT; SILICON SURFACES; SPIN CASTING; SUBSTRATE COMPOSITION; SUBSTRATE SURFACE; THICK SAMPLES; THICKNESS DEPENDENCE; VACUUM ENVIRONMENT;

ELLIPSOMETRY; PLASTIC FILMS; POLYSTYRENES; SURFACE ROUGHNESS; THICK FILMS; VACUUM;

GLASS TRANSITION;

EID: 84864999119     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.86.021501     Document Type: Article

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