Probe Segregation and Tg Determination of a Supported Ultra-Thin Polystyrene Film Studied by X-ray and Neutron Reflectivity, and SIMS

Polymer Engineering and Science

Volumn 43, Issue 6, 2003, Pages 1241-1249

  White, Chris ^a   Wu, Wen Li ^a   Pu, Yuxie ^b   Rafailovich, M ^b   Sokolov, J ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; GLASS TRANSITION; INTERFACES (MATERIALS); NEUTRON REFLECTION; SECONDARY ION MASS SPECTROMETRY; SUPERCONDUCTING TRANSITION TEMPERATURE; THERMAL CYCLING; THERMAL EXPANSION; ULTRATHIN FILMS;

CHROMOPHORE SEGREGATION; X-RAY REFLECTIVITY;

POLYSTYRENES;

EID: 1542709585     PISSN: 00323888     EISSN: None     Source Type: Journal    
DOI: 10.1002/pen.10105     Document Type: Article

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