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Volumn 41, Issue 16, 2008, Pages 5978-5980

Temperature-modulated ellipsometry: A new probe for glass transition in thin supported polymer films

Author keywords

[No Author keywords available]

Indexed keywords

MODULATED ELLIPSOMETRY; OVERLAPPING PROCESSES; TM MODES;

EID: 51549088410     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma8011416     Document Type: Article
Times cited : (10)

References (13)
  • 6
    • 0028584992 scopus 로고    scopus 로고
    • Moynihan, C. T. In Assignment of the Glass Transition, ASTM STP 1249; Seyler, R. J., Ed.; American Society for Testing and Materials: Philadelphia, 1994; pp 32-49.
    • Moynihan, C. T. In Assignment of the Glass Transition, ASTM STP 1249; Seyler, R. J., Ed.; American Society for Testing and Materials: Philadelphia, 1994; pp 32-49.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.