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Volumn 41, Issue 16, 2008, Pages 5978-5980
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Temperature-modulated ellipsometry: A new probe for glass transition in thin supported polymer films
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Author keywords
[No Author keywords available]
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Indexed keywords
MODULATED ELLIPSOMETRY;
OVERLAPPING PROCESSES;
TM MODES;
ABS RESINS;
ELECTRON BEAM LITHOGRAPHY;
ELLIPSOMETRY;
ESTERS;
GLASS;
POLYMERS;
POLYSTYRENES;
SEPARATION;
STORAGE ALLOCATION (COMPUTER);
THICK FILMS;
THIN FILM DEVICES;
THIN FILMS;
GLASS TRANSITION;
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EID: 51549088410
PISSN: 00249297
EISSN: None
Source Type: Journal
DOI: 10.1021/ma8011416 Document Type: Article |
Times cited : (10)
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References (13)
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