Ad hoc auto-tuning of aberrations using high-resolution STEM images by autocorrelation function

Microscopy and Microanalysis

Volumn 18, Issue 4, 2012, Pages 705-710

  Sawada, Hidetaka ^a   Watanabe, Masashi ^b   Chiyo, Izuru ^a  

^a JEOL LTD   (Japan)

^b Lehigh University   (United States)

Author keywords

aberration; auto tuning; autocorrelation function; crystalline specimen; high resolution STEM image

Indexed keywords

EID: 84864768577     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612001304     Document Type: Conference Paper

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