The influence of oxidation time on the properties of oxidized zinc films

Superlattices and Microstructures

Volumn 52, Issue 3, 2012, Pages 577-584

  Rambu, A P ^a  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

Author keywords

Electrical conductivity; Internal stress; Polycrystalline structure; VHR model

Indexed keywords

AFM; CHARACTERISTIC PARAMETER; ELECTRICAL BEHAVIORS; ELECTRICAL CONDUCTIVITY; ELECTRONIC TRANSPORT; LOW TEMPERATURES; MOTT VARIABLE-RANGE HOPPING; OPEN ATMOSPHERE; OXIDATION OF ZN; OXIDATION TIME; POLYCRYSTALLINE STRUCTURE; PREFERENTIAL ORIENTATION; STRUCTURAL CHARACTERISTICS; TEMPERATURE DEPENDENCE; THERMAL OXIDATION; XRD; ZINC OXIDE THIN FILMS; ZNO FILMS;

ELECTRIC CONDUCTIVITY; METALLIC FILMS; RESIDUAL STRESSES; SURFACE ROUGHNESS; TEMPERATURE DISTRIBUTION; THERMAL EVAPORATION; ZINC; ZINC OXIDE;

INTERNAL OXIDATION;

EID: 84864067778     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2012.05.024     Document Type: Article

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