|
Volumn 518, Issue 16, 2010, Pages 4615-4618
|
On the structural and electrical characteristics of zinc oxide thin films
|
Author keywords
Electrical properties; Rf magnetron sputtering; Thin films; Zinc oxide
|
Indexed keywords
COOLING PROCESS;
ELECTRICAL CHARACTERISTIC;
ELECTRICAL CONDUCTION;
ELECTRICAL PROPERTY;
ELECTRICAL STUDIES;
GLASS SUBSTRATES;
OXIDATION CONDITIONS;
POLYCRYSTALLINE;
POLYCRYSTALLINE STRUCTURE;
RADIO FREQUENCY MAGNETRON SPUTTERING;
RF-MAGNETRON SPUTTERING;
STRUCTURAL AND ELECTRICAL PROPERTIES;
SUBSTRATE SURFACE;
THERMAL ACTIVATION ENERGIES;
VAN DER PAUW METHOD;
WURTZITES;
ZINC OXIDE THIN FILMS;
ZNO;
ZNO FILMS;
ZNO LAYERS;
ZNO THIN FILM;
ACTIVATION ENERGY;
MAGNETRON SPUTTERING;
METALLIC FILMS;
OPTICAL FILMS;
OXIDE FILMS;
STRUCTURAL PROPERTIES;
SUBSTRATES;
SURFACE ROUGHNESS;
THIN FILMS;
VAPOR DEPOSITION;
ZINC;
ZINC OXIDE;
ZINC SULFIDE;
ELECTRIC PROPERTIES;
|
EID: 77955644260
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2009.12.044 Document Type: Conference Paper |
Times cited : (12)
|
References (22)
|