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Volumn 518, Issue 16, 2010, Pages 4615-4618

On the structural and electrical characteristics of zinc oxide thin films

Author keywords

Electrical properties; Rf magnetron sputtering; Thin films; Zinc oxide

Indexed keywords

COOLING PROCESS; ELECTRICAL CHARACTERISTIC; ELECTRICAL CONDUCTION; ELECTRICAL PROPERTY; ELECTRICAL STUDIES; GLASS SUBSTRATES; OXIDATION CONDITIONS; POLYCRYSTALLINE; POLYCRYSTALLINE STRUCTURE; RADIO FREQUENCY MAGNETRON SPUTTERING; RF-MAGNETRON SPUTTERING; STRUCTURAL AND ELECTRICAL PROPERTIES; SUBSTRATE SURFACE; THERMAL ACTIVATION ENERGIES; VAN DER PAUW METHOD; WURTZITES; ZINC OXIDE THIN FILMS; ZNO; ZNO FILMS; ZNO LAYERS; ZNO THIN FILM;

EID: 77955644260     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.12.044     Document Type: Conference Paper
Times cited : (12)

References (22)
  • 19
    • 0004274069 scopus 로고
    • Wiley-Interscience New York
    • H.F. Wolf Semiconductors 1971 Wiley-Interscience New York
    • (1971) Semiconductors
    • Wolf, H.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.