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Volumn 518, Issue 23, 2010, Pages 7174-7182

Effect of vacuum magnetic annealing on the structural and physical properties of the Ni and Al co-doped ZnO films

Author keywords

Carrier transport; Ferromagnetism; Magnetic annealing; Magnetization behavior; Ni and Al co doped Zinc oxide; Sputtering; Structural properties; Thin films

Indexed keywords

ANISOTROPIC MAGNETIZATION; ANNEALED FILMS; BAND CONDUCTION; CO-DOPED; CO-DOPED ZNO; COLUMNAR GRAIN; COSPUTTERING; DIFFRACTION PEAKS; FILM PLANES; FREE ELECTRON CONCENTRATION; GLASS SUBSTRATES; GRAIN SIZE; GROWING DIRECTION; HIGH TEMPERATURE RANGE; IN-VACUUM; LOW TEMPERATURES; MAGNETIC ANNEALING; MAGNETIZATION BEHAVIOR; NI CONTENT; ORIENTATION GROWTH; ROOM TEMPERATURE; ROOM TEMPERATURE FERROMAGNETISM; STRUCTURAL AND PHYSICAL PROPERTIES; TEMPERATURE DEPENDENCE; THERMALLY ACTIVATED; TRANSPORT MECHANISM; VARIABLE RANGE HOPPING; WURTZITE STRUCTURE; ZNO;

EID: 77956229129     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.07.045     Document Type: Article
Times cited : (27)

References (33)
  • 18
    • 77956224932 scopus 로고
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards Bethlehem, PA
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards Bethlehem, PA, JCPDS Card 36-1451 1986
    • (1986) JCPDS Card 36-1451


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.