Synchrotron radiation X-ray topography and X-ray diffraction of homoepitaxial GaN grown on ammonothermal GaN

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 9, Issue 7, 2012, Pages 1630-1632

  Sintonen, Sakari ^a   Ali, Muhammad ^a   Suihkonen, Sami ^a   Kostamo, Pasi ^a   Svensk, Olli ^a   Sopanen, Markku ^a   Lipsanen, Harri ^a   Paulmann, Carsten ^b   Tuomi, Turkka O ^a   Zajac, Marcin ^c  

^a AALTO UNIVERSITY   (Finland)

^b DESY   (Germany)

^c Ammono Spzoo   (Poland)

Author keywords

Dislocations; GaN; X ray diffraction; X ray topography

Indexed keywords

AMMONOTHERMAL; CRYSTAL QUALITIES; DISLOCATION DENSITIES; GAN; GAN FILM; GAN LAYERS; GAN SUBSTRATE; HOMOEPITAXIAL; MIXED TYPE; ROCKING CURVES; X-RAY TOPOGRAPHY; XRD;

DISLOCATIONS (CRYSTALS); SYNCHROTRON RADIATION; X RAY DIFFRACTION;

GALLIUM NITRIDE;

EID: 84864025209     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.201100693     Document Type: Article

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