The relationship between the doping levels and some physical properties of SnO 2:F thin films spray-deposited on optical glass

Pramana - Journal of Physics

Volumn 79, Issue 1, 2012, Pages 137-150

  Tatar, Demet ^a   Düzgün, Bahattin ^a  

^a ATATÜRK UNIVERSITY   (Turkey)

Author keywords

Optoelectronic; SnO 2:F; Spray pyrolysis; Thin films

Indexed keywords

AFM; CONDUCTING LAYERS; DEPOSITED FILMS; DIFFRACTOGRAMS; DOPED FILMS; DOPING LEVELS; ELECTRICAL CONDUCTIVITY; ELECTRICAL STUDIES; ELECTROCHROMICS; FLUORINE DOPING; FLUORINE-DOPED TIN OXIDE FILMS; GRAIN SIZE; HALL EFFECT MEASUREMENT; NANOCRYSTALLINE PARTICLE; OPTOELECTRONIC; PHOTOVOLTAIC DEVICES; POLYCRYSTALLINE; ROOM TEMPERATURE; SNO 2:F; SPRAY-DEPOSITED; STRUCTURAL AND OPTICAL PROPERTIES; UV-VIS SPECTROPHOTOMETRY; VAN DER PAUW; VISIBLE TRANSMITTANCE; XRD PATTERNS;

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; CRYSTAL GROWTH; ELECTRIC CONDUCTIVITY; FILM THICKNESS; FLUORINE; NANOCOMPOSITES; OPTICAL GLASS; OPTICAL PROPERTIES; OXIDE FILMS; SPRAY PYROLYSIS; THIN FILMS; TIN; TIN OXIDES; X RAY DIFFRACTION;

SEMICONDUCTOR DOPING;

EID: 84863845504     PISSN: 03044289     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12043-012-0288-3     Document Type: Article

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