Effect of the substrate temperature on the electrical and structural properties of spray-deposited SnO2:F thin films

Materials Science in Semiconductor Processing

Volumn 12, Issue 3, 2009, Pages 122-125

  Ikhmayies, Shadia J ^a   Ahmad Bitar, Riyad N ^b  

^a APPLIED SCIENCE PRIVATE UNIVERSITY   (Jordan)

^b UNIVERSITY OF JORDAN   (Jordan)

Author keywords

Semiconductors; Spray pyrolysis; Thin films

Indexed keywords

ELECTRICAL AND STRUCTURAL PROPERTIES; GRAIN SIZE; IV CHARACTERISTICS; NEW DIRECTIONS; POLYCRYSTALLINE; SCANNING ELECTRON MICROSCOPE; SEM; SEM IMAGE; SEMICONDUCTORS; SPRAY-DEPOSITED; SUBSTRATE TEMPERATURE;

CRYSTAL GROWTH; CRYSTALLIZATION; DIFFRACTION GRATINGS; DIFFRACTION PATTERNS; ELECTRIC PROPERTIES; FILM GROWTH; GRAIN BOUNDARIES; GRAIN GROWTH; HOLOGRAPHIC INTERFEROMETRY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SPRAY PYROLYSIS;

EID: 73049090042     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2009.09.003     Document Type: Article

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