Kramers-Kronig constrained modeling of soft x-ray reflectivity spectra: Obtaining depth resolution of electronic and chemical structure

Physical Review B - Condensed Matter and Materials Physics

Volumn 86, Issue 2, 2012, Pages

  Stone, Kevin H ^a   Valvidares, S Manuel ^b   Kortright, Jeffrey B ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b ALBA SYNCHROTRON LIGHT SOURCE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84863668680     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.024102     Document Type: Article

References (36)

1. H. A. Dürr, E. Dudzik, S. S. Dhesi, J. B. Goedkoop, G. van der Laan, M. Belakhovsky, C. Mocuta, A. Marty, and Y. Samson, Science SCIEAS 0036-8075 10.1126/science.284.5423.2166 284, 2166 (1999). (Pubitemid 29297474)
2. J. B. Kortright, S.-K. Kim, G. P. Denbeaux, G. Zeltzer, K. Takano, and E. E. Fullerton, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.64.092401 64, 092401 (2001).
3. P. Abbamonte, L. Venema, A. Rusydi, G. A. Sawatzky, G. Logvenov, and I. Bozovic, Science SCIEAS 0036-8075 10.1126/science.1070903 297, 581 (2002). (Pubitemid 34815338)
4. S. B. Wilkins, P. D. Hatton, M. D. Roper, D. Prabhakaran, and A. T. Boothroyd, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.90.187201 90, 187201 (2003).
5. K. J. Thomas, J. P. Hill, S. Grenier, Y.-J. Kim, P. Abbamonte, L. Venema, A. Rusydi, Y. Tomioka, Y. Tokura, D. F. McMorrow, G. Sawatzky, and M. van Veenendaal, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92.237204 92, 237204 (2004).
6. S. Roy, M. R. Fitzsimmons, S. Park, M. Dorn, O. Petracic, I. V. Roshchin, Z.-P. Li, X. Batlle, R. Morales, A. Misra, X. Zhang, K. Chesnel, J. B. Kortright, S. K. Sinha, and I. K. Schuller, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.95.047201 95, 047201 (2005). (Pubitemid 41506237)
7. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
8. E. D. Palik, Handbook of Optical Constants of Solids (Academic Press, Inc., Orlando, Florida, 1985).
9. H. G. Tompkins and W. A. McGahan, Spectroscopic Ellipsometry and Reflectometry: A Users Guide (John Wiley and Sons, New York, NY, 1999).
10. S. D. Brown, L. Bouchenoire, P. Thompson, R. Springell, A. Mirone, W. G. Stirling, A. Beesley, M. F. Thomas, R. C. C. Ward, M. R. Wells, S. Langridge, S. W. Zochowski, and G. H. Lander, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.77.014427 77, 014427 (2008).
11. L. Bouchenoire, A. Mirone, S. D. Brown, P. Strange, T. Wood, P. Thompson, D. Fort, and J. Fernández-Rodríguez, New J. Phys. NJOPFM 1367-2630 10.1088/1367-2630/11/12/123011 11, 123011 (2009).
12. J. M. Tonnerre, L. Seve, D. Raoux, G. Soullie, B. Rodmacq, and P. Wolfers, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.75.740 75, 740 (1995).
13. M. Wormington, C. Panaccione, K. Matney, and D. Bowen, Philos. Trans. R. Soc. London A PTRMAD 1364-503X 10.1098/rsta.1999.0469 357, 2827 (1999).
14. M. Sacchi, C. F. Hague, E. M. Gullikson, and J. H. Underwood, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57.108 57, 108 (1998).
15. I. Diel, J. Friedrich, C. Kunz, S. DiFornzo, B. R. Muller, and W. Jark, Appl. Opt. APOPAI 0003-6935 10.1364/AO.36.006376 36, 6376 (1997).
16. J. E. Prieto, F. Heigl, O. Krupin, G. Kaindl, and K. Starke, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.134453 68, 134453 (2003).
17. A. van der Lee, F. Salah, and B. Harzallah, J. Appl. Crystallogr. JACGAR 0021-8898 10.1107/S0021889807032207 40, 820 (2007). (Pubitemid 47396332)
18. S. M. Danauskas, D. Li, M. Meron, B. Lin, and K. Y. C. Lee, J. Appl. Crystallogr. JACGAR 0021-8898 10.1107/S0021889808032445 41, 1187 (2008).
19. R. Soufli, A. L. Aquila, F. Salmassi, M. Fernanxez-Perea, and E. M. Gullikson, Appl. Opt. APOPAI 0003-6935 10.1364/AO.47.004633 47, 4633 (2008).
20. M. Mezger, B. Jerome, J. B. Kortright, M. Valvidares, E. M. Gullikson, A. Giglia, N. Mahne, and S. Nannarone, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.83.155406 83, 155406 (2011).
21. D. Ksenzov, T. Panzner, C. Schlemper, C. Morawe, and U. Pietsch, Appl. Opt. APOPAI 0003-6935 10.1364/AO.48.006684 48, 6684 (2009).
22. A. B. Kuzmenko, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1979470 76, 083108 (2005). (Pubitemid 41430229)
23. S. M. Valvidares, M. Huijben, P. Yu, R. Ramesh, and J. B. Kortright, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.82.235410 82, 235410 (2010).
24. W. Meevasana, P. D. C. King, R. H. He, S. K. Mo, M. Hashimoto, A. Tamai, P. Songsiriritthigul, F. Baumberger, and Z. X. Shen, Nat. Mater. 1476-1122 10.1038/nmat2943 10, 114 (2011).
25. A. F. Santander-Syro, O. Copie, T. Kondo, F. Fortuna, S. Paihes, R. Weht, X. G. Qiu, F. Bertran, A. Niolaou, A. Taleb-Ibrahimi, P. L. Fevre, G. Herranz, M. Bibes, N. Reyren, Y. Apertet, P. Lecoeur, A. Barthelemy, and M. J. Rozenberg, Nature (London) NATUAS 0028-0836 10.1038/nature09720 469, 189 (2011).
26. K. Szot and W. Speier, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.60. 5909 60, 5909 (1999).
27. C. D. Keefe, J. Mol. Spectrosc. JMOSA3 0022-2852 10.1006/jmsp.2000.8254 205, 261 (2001). (Pubitemid 32873846)
28. D. S. Sivia and J. Skilling, Data Analysis: A Bayesian Tutorial (Oxford University Press Inc., New York, 2007).
29. S. F. Gull and G. J. Daniell, Nature (London) NATUAS 0028-0836 10.1038/272686a0 272, 686 (1978).
30. J. Skilling and R. K. Bryan, Mon. Not. R. Astron. Soc. 211, 111 (1984).
31. M. Sakata and M. Sato, Acta Crystallogr. Sect. A ACACEQ 0108-7673 10.1107/S0108767389012377 46, 263 (1990).
32. ) 2.
33. L. G. Parratt, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.95.359 95, 359 (1954).
34. L. Névot and P. Croce, Rev. Phys. Appl. (Paris) RPHAAN 0035-1687 10.1051/rphysap:01980001503076100 15, 761 (1980).
35. B. Henke, E. Gullikson, and J. Davis, At. Data Nucl. Data Tables ADNDAT 0092-640X 10.1006/adnd.1993.1013 54, 181 (1993).
36. F. M. F. deGroot, J. C. Fuggle, B. T. Thole, and G. A. Sawatzky, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.41.928 41, 928 (1990).