SCOPUS 정보 검색 플랫폼

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 9, 2001, Pages 924011-924014

Soft-x-ray small-angle scattering as a sensitive probe of magnetic and charge heterogeneity

(6) Kortright, J B b Kim, Sang Koog b,c Denbeaux, G P c Zeltzer, G d,e Takano, K d Fullerton, Eric E d

a Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c IBM Almaden Research Center ^*

d IBM ALMADEN RESEARCH CENTER (United States)

e STANFORD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; PLATINUM;

ANISOTROPY; ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ENERGY; IMAGE ANALYSIS; IMAGING SYSTEM; MAGNETISM; MODEL; QUANTITATIVE GENETICS; REACTION ANALYSIS; X RAY CRYSTALLOGRAPHY;

EID: 0035449077 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.64.092401 Document Type: Article

Times cited : (93)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.