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Volumn 297, Issue 5581, 2002, Pages 581-584
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A structural probe of the doped holes in cuprate superconductors
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
COPPER OXIDES;
STRUCTURAL ANALYSIS;
THERMAL EFFECTS;
THIN FILMS;
X RAY SCATTERING;
CHARGE DENSITY;
SUPERCONDUCTING MATERIALS;
COPPER DERIVATIVE;
OXYGEN;
OXYGEN;
PHYSICS;
ARTICLE;
CHEMICAL STRUCTURE;
CONDUCTOR;
ELECTRICITY;
FILM;
PRIORITY JOURNAL;
RADIATION SCATTERING;
STRUCTURE ANALYSIS;
TEMPERATURE;
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EID: 0037178712
PISSN: 00368075
EISSN: None
Source Type: Journal
DOI: 10.1126/science.1070903 Document Type: Article |
Times cited : (101)
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References (18)
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