Depth profile of uncompensated spins in an exchange bias system

Physical Review Letters

Volumn 95, Issue 4, 2005, Pages

  Roy, S ^a   Fitzsimmons, M R ^b   Park, S ^b   Dorn, M ^a   Petracic, O ^a,c   Roshchin, Igor V ^a   Li, Zhi Pan ^a   Batlle, X ^a,d   Morales, R ^a,e   Misra, A ^b   Zhang, X ^b   Chesnel, K ^f   Kortright, J B ^f   Sinha, S K ^a,b   Schuller, Ivan K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF DUISBURG ESSEN   (Germany)

^d UNIVERSITY OF BARCELONA   (Spain)

^e UNIVERSITY OF OVIEDO   (Spain)

^f LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNET BULK; SOFT X-RAY BEAMS;

ANTIFERROMAGNETISM; INTERFACES (MATERIALS); NEUTRONS; SENSITIVITY ANALYSIS; X RAYS;

ION EXCHANGE;

EID: 27144520817     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.047201     Document Type: Article

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