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Volumn 42 1, Issue , 2011, Pages 476-478

35.2: High-performance solution-processed oxide TFT with dual channel at low temperature

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; CARRIER CONCENTRATION; CARRIER MOBILITY; CARRIER TRANSPORT; INDIUM COMPOUNDS; TEMPERATURE; THIN FILMS; THRESHOLD VOLTAGE; ZINC COMPOUNDS;

EID: 84863214415     PISSN: 0097966X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1889/1.3621359     Document Type: Conference Paper
Times cited : (2)

References (12)
  • 1
    • 9744248669 scopus 로고    scopus 로고
    • Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors
    • K. Nomura, H. Ohta, A. Takagi, T. Kamiya, M. Hirano, H. Hosono, "Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors," Nature 432, 488, (2004).
    • (2004) Nature , vol.432 , pp. 488
    • Nomura, K.1    Ohta, H.2    Takagi, A.3    Kamiya, T.4    Hirano, M.5    Hosono, H.6
  • 4
    • 77951862636 scopus 로고    scopus 로고
    • Investigation of the effects of mg incorporation into inzno for high performance and high-stability solution-processed thin film transistors
    • G. H. Kim, W. H. Jeong, B. D. Ahn, H. S. Shin, H. J. Kim, H. J. Kim, M.-K. Ryu, K.-B. Park, J.-B. Seon, and S. Y. Lee, "Investigation of the effects of Mg incorporation into InZnO for high performance and high-stability solution-processed thin film transistors", Appl. Phys. Lett. 96, 163506 (2010).
    • (2010) Appl. Phys. Lett. , vol.96 , pp. 163506
    • Kim, G.H.1    Jeong, W.H.2    Ahn, B.D.3    Shin, H.S.4    Kim, H.J.5    Kim, H.J.6    Ryu, M.-K.7    Park, K.-B.8    Seon, J.-B.9    Lee, S.Y.10
  • 8
    • 34250621864 scopus 로고    scopus 로고
    • Ageneral route to printable high-mobility transparent amorphous oxide semiconductors
    • D.-H. Lee, Y.-J. Chang, G. S. Herman, and C.-H. Chang, "AGeneral Route to Printable High-Mobility Transparent Amorphous Oxide Semiconductors", Adv. Mater. 19, 843 (2007).
    • (2007) Adv. Mater. , vol.19 , pp. 843
    • Lee, D.-H.1    Chang, Y.-J.2    Herman, G.S.3    Chang, C.-H.4
  • 10
    • 77952578784 scopus 로고    scopus 로고
    • Electrical properties of yttrium-indium-zinc-oxide thin film transistors fabricated using the sol-gel process and various yttrium compositions
    • H. S. Shin, G. H. Kim, W. H. Jeong, B. D. Ahn, and H. J. Kim, "Electrical properties of yttrium-indium-zinc-oxide thin film transistors fabricated using the sol-gel process and various yttrium compositions", Jpn. J. Appl. Phys. 49, 03CB01 (2010).
    • (2010) Jpn. J. Appl. Phys. , vol.49
    • Shin, H.S.1    Kim, G.H.2    Jeong, W.H.3    Ahn, B.D.4    Kim, H.J.5
  • 11
    • 77950192258 scopus 로고    scopus 로고
    • Role of gallium doping in dramatically lowering amorphous-oxide processing temperatures for solution-derived indium zinc oxide thin-film transistors
    • S. Jeong, Y.-G. Ha, J. Moon, A. Facchetti, and T. J. Marks, "Role of Gallium Doping in Dramatically Lowering Amorphous-Oxide Processing Temperatures for Solution-Derived Indium Zinc Oxide Thin-Film Transistors", Adv. Mater. 22, 1346 (2010).
    • (2010) Adv. Mater. , vol.22 , pp. 1346
    • Jeong, S.1    Ha, Y.-G.2    Moon, J.3    Facchetti, A.4    Marks, T.J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.