Dynamic test scheduling for analog circuits for improved test quality

26th IEEE International Conference on Computer Design 2008, ICCD

Volumn , Issue , 2008, Pages 227-233

  Yilmaz, Ender ^a   Ozev, Sule ^a  

^a Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC TESTS; LNA CIRCUITS; SET COVER METHODS; SPECIFICATION PARAMETERS; TEST QUALITIES; TEST SCHEDULING; TEST TIME; TEST TIME REDUCTIONS;

ANALOG CIRCUITS; LOW NOISE AMPLIFIERS; SCHEDULING; SPECIFICATIONS;

TESTING;

EID: 62349138241     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2008.4751866     Document Type: Conference Paper

References (12)

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