Maintaining accuracy of test compaction through adaptive re-learning

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2009, Pages 257-263

  Biswas, Sounil ^a   Blanton, R D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Adaptive relearning; Integrated system test; Statistical learning; Stratified sampling; Test compaction

Indexed keywords

ADAPTIVE RELEARNING; INTEGRATED SYSTEM TEST; STATISTICAL LEARNING; STRATIFIED SAMPLING; TEST COMPACTION;

ACCELEROMETERS; COMPACTION; EDUCATION; INTEGRATED CONTROL; INTEGRATED OPTICS; PHASE LOCKED LOOPS; SAMPLING;

TESTING;

EID: 70350399360     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2009.59     Document Type: Conference Paper

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