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Volumn 93, Issue , 2012, Pages 5-9
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Analysis of the electrical characteristics of the Ag/ZnO Schottky barrier diodes on F-doped SnO 2 glass substrates by pulsed laser deposition
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Author keywords
Barrier height; Schottky barrier; Series resistance; ZnO films
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Indexed keywords
BARRIER HEIGHTS;
C-V CHARACTERISTIC;
C-V MEASUREMENT;
CAPACITANCE VOLTAGE MEASUREMENTS;
CURRENT VOLTAGE;
ELECTRICAL CHARACTERISTIC;
GLASS SUBSTRATES;
HIGH QUALITY;
I-V MEASUREMENTS;
IDEALITY FACTORS;
IV CHARACTERISTICS;
RECTIFYING BEHAVIORS;
SCHOTTKY BARRIER HEIGHTS;
SCHOTTKY BARRIERS;
SCHOTTKY CONTACTS;
SCHOTTKY JUNCTIONS;
SEMICONDUCTOR LAYERS;
SERIES RESISTANCES;
ZNO FILMS;
ZNO THIN FILM;
ELECTRIC PROPERTIES;
ELECTRIC RESISTANCE;
METALLIC FILMS;
PULSED LASER DEPOSITION;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTOR METAL BOUNDARIES;
SUBSTRATES;
QUALITY CONTROL;
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EID: 84862780853
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2011.12.009 Document Type: Article |
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Times cited : (41)
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References (16)
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