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Volumn 12, Issue 6, 2010, Pages 2277-2286

Current-voltage and capacitance-voltage studies of nanocrystalline CdSe/Au Schottky junction interface

Author keywords

Current Voltage; Interface; Nanostructure; Schottky; Thin film

Indexed keywords

BAND GAPS; BULK DEVICES; C-V CHARACTERISTIC; CAPACITANCE RESPONSE; CAPACITANCE VOLTAGE; CDSE NANOCRYSTALS; CURRENT-VOLTAGE; DEVICE CHARACTERISTICS; DEVICE INTERFACES; DIFFERENT FREQUENCY; ELECTRODEPOSITION TECHNIQUE; INDIUM TIN OXIDE SUBSTRATES; IV CHARACTERISTICS; LOW FREQUENCY; MOTT-SCHOTTKY; MOTT-SCHOTTKY PLOTS; NANOCRYSTALLINE THIN FILMS; NANOCRYSTALLINES; NATIVE OXIDE LAYER; RUTHERFORD BACK-SCATTERING; SCHOTTKY; SCHOTTKY BARRIERS; SCHOTTKY JUNCTIONS; SERIES RESISTANCES; THIN OXIDE LAYERS;

EID: 77955012807     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-009-9796-6     Document Type: Article
Times cited : (11)

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