Correcting scanning instabilities from images of periodic structures

Ultramicroscopy

Volumn 118, Issue , 2012, Pages 67-76

  Braidy, Nadi ^a   Le Bouar, Yann ^b   Lazar, Sorin ^c,d   Ricolleau, Christian ^e  

^a UNIVERSITÉ DE SHERBROOKE   (Canada)

^b CNRS   (France)

^c Thermo Fisher Scientific   (United States)

^d MCMASTER UNIVERSITY   (Canada)

^e UNIVERSITÉ PARIS DIDEROT   (France)

Author keywords

Flagging; Fourier transform; High angle annular dark field; Lattice image; Restoration technique; Scanning instability; Scanning probe transmission microcopy; Skipping; Streaking

Indexed keywords

FLAGGING; HIGH-ANGLE ANNULAR DARK FIELDS; LATTICE IMAGES; RESTORATION TECHNIQUES; SCANNING PROBES; SKIPPING; STREAKING;

FOURIER TRANSFORMS; TRANSMISSION ELECTRON MICROSCOPY;

SCANNING;

NANOCRYSTAL;

ACCURACY; ALGORITHM; ARTICLE; FOURIER TRANSFORMATION; IMAGE ANALYSIS; PERCEPTION DISORDER; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCINTISCANNING; VALIDITY;

ALGORITHMS; FOURIER ANALYSIS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; MODELS, THEORETICAL; NANOPARTICLES; REPRODUCIBILITY OF RESULTS;

EID: 84862652366     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.04.001     Document Type: Article

References (21)

1. Krivanek O.L., Dellby N., Lupini A.R. Towards sub-Ångstrom electron beams. Ultramicroscopy 1999, 78:1-11.
2. Muller D.A., Kirkland E.J., Thomas M.G., Grazul J.L., Fitting L., Weyland M. Room design for high-performance electron microscopy. Ultramicroscopy 2006, 106:1033-1040.
3. Brown L.G. Survey of image registration techniques. ACM Computing Surveys 1992, 24:325-376.
4. Rečnik A., Möbus G., Šturm S. IMAGE-WARP: A real-space restoration method for high-resolution STEM images using quantitative HRTEM analysis. Ultramicroscopy 2005, 103:285-301.
5. Sanchez A.M., Galindo P.L., Kret S., Falke M., Beanland R., Goodhew P.J. An approach to the systematic distortion correction in aberration-corrected HAADF images. Journal of Microscopy 2006, 221:1-7.
6. Hÿtch M.J., Snoeck E., Kilaas R. Quantitative measurement of displacement and strain fields from HREM micrographs. Ultramicroscopy 1998, 74:131-146.
7. T.U. Graz D.M. Script, Database, 2012 (accessed 01.01.12). http://www.felmi-zfe.tugraz.at/dm_scripts/welcome.html.
8. Rouvière J.L., Sarigiannidou E. Theoretical discussions on the geometrical phase analysis. Ultramicroscopy 2005, 106:1-17.
9. Mitchell D.R.G., Schaffer B. Scripting-customised microscopy tools for Digital Micrograph™. Ultramicroscopy 2005, 103:319-332.
10. V. Hou, Live Image Processing (LIP) Suite, 2012 (accessed 01.01.12). http://donation.tugraz.at/dm/source_codes/217.
11. HREM Research, Image Processing Utility (IPU), 2012 (accessed 01.01.12). http://www.hremresearch.com/Eng/plugin/plugin004/index.html.
12. V. Hou, Gaussian Fit, 2012 (accessed 01.01.12). http://donation.tugraz.at/dm/source_codes/260.
13. Alloyeau D., Langlois C., Ricolleau C., Le Bouar Y., Loiseau A. A TEM in situ experiment as a guideline for the synthesis of as-grown ordered CoPt nanoparticles. Nanotechnology 2007, 18.
14. Van Aert S., Batenburg K.J., Rossell M.D., Erni R., Van Tendeloo G. Three-dimensional atomic imaging of crystalline nanoparticles. Nature 2011, 470:374-377.
15. Lazar S., Shao Y., Gunawan L., Nechache R., Pignolet A., Botton G.A. Imaging, core-loss, and low-loss electron-energy-loss spectroscopy mapping in aberration-corrected STEM. Microscopy and Microanalysis 2010, 16:416-424.
16. Morgan D.G., Ramasse Q.M., Browning N.D. Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images. Journal of Electron Microscopy 2009, 58:223-244.
17. Kirkland A.I., Saxton W.O. Cation segregation in Nb16W18O94 using high angle annular dark field scanning transmission electron microscopy and image processing. Journal of Microscopy 2002, 206:1-6.
18. Nellist P.D., Pennycook S.J. Accurate structure determination from image reconstruction ADF STEM. Journal of Microscopy 1998, 190:159-170.
19. Nakanishi N., Yamazaki T., Rečnik A., Čeh M., Kawasaki M., Watanabe K., Shiojiri M. Retrieval process of high-resolution HAADF-STEM images. Journal of Electron Microscopy 2002, 51:383-390.
20. Findlay S.D., Shibata N., Sawada H., Okunishi E., Kondo Y., Yamamoto T., Ikuhara Y. Robust atomic resolution imaging of light elements using scanning transmission electron microscopy. Applied Physics Letters 2009, 95.
21. Ishikawa R., Okunishi E., Sawada H., Kondo Y., Hosokawa F., Abe E. Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy. Nature Materials 2011, 10:278-281.