SCOPUS 정보 검색 플랫폼

Volumn 206, Issue 1, 2002, Pages 1-6

Cation segregation in Nb16W18O94 using high angle annular dark field scanning transmission electron microscopy and image processing

(2) Kirkland, A I a Saxton, W O a

a Department of Materials Science ^* (United Kingdom)

Author keywords

High angle annular dark field imaging; Image processing; Inorganic oxides; Scanning transmission electron microscopy

Indexed keywords

ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; POSITIVE IONS; SCANNING ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS;

ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; CATION SEGREGATIONS; COMPLEX OXIDES; ELECTRON IMAGES; HIGH-ANGLE ANNULAR DARK FIELDS; HIGH-ANGLE ANNULAR DARK-FIELD IMAGING; IMAGES PROCESSING; INORGANIC OXIDES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

NIOBIUM COMPOUNDS;

CATION; NIOBIUM; OXIDE; OXYGEN; TUNGSTEN;

ACCURACY; ANALYTIC METHOD; ARTICLE; CALCULATION; CRYSTAL; FIELD EMISSION; ILLUMINATION; IMAGE ANALYSIS; IMAGE PROCESSING; MICROSCOPE IMAGE; PRIORITY JOURNAL; REGRESSION ANALYSIS; SCANNING ELECTRON MICROSCOPY; SIGNAL NOISE RATIO;

EID: 0036091809 PISSN: 00222720 EISSN: None Source Type: Journal
DOI: 10.1046/j.1365-2818.2002.01002.x Document Type: Article

Times cited : (20)

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