B 4C thin films for neutron detection

Journal of Applied Physics

Volumn 111, Issue 10, 2012, Pages

  Höglund, Carina ^a,b   Birch, Jens ^b   Andersen, Ken ^a   Bigault, Thierry ^c   Buffet, Jean Claude ^c   Correa, Jonathan ^c   Van Esch, Patrick ^c   Guerard, Bruno ^c   Hall Wilton, Richard ^a   Jensen, Jens ^b   Khaplanov, Anton ^a,c   Piscitelli, Francesco ^c   Vettier, Christian ^a,d   Vollenberg, Wilhelmus ^e   Hultman, Lars ^b  

^a EUROPEAN SPALLATION SOURCE ERIC   (Sweden)

^b LINKÖPING UNIVERSITY   (Sweden)

^c INSTITUT LAUE LANGEVIN   (France)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e CERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION MEASUREMENTS; BORON-10; BULK VALUE; C FILMS; DC MAGNETRON SPUTTERING; DETECTION EFFICIENCY; ELASTIC RECOIL DETECTION ANALYSIS; FILM PURITY; FILM-SUBSTRATE ADHESION; INDUSTRIAL DEPOSITION SYSTEMS; LAYER THICKNESS; MONTE CARLO SIMULATION; NEUTRON DETECTION; NEUTRON WAVELENGTHS; NUMBER OF LAYERS; SI WAFER; SUBSTRATE TEMPERATURE; UNIFORM LAYER; X RAY REFLECTIVITY;

ADHESION; ALUMINUM; BORON; DEPOSITION; DEPOSITION RATES; MONTE CARLO METHODS; NEUTRON DETECTORS; NEUTRON RADIOGRAPHY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; THIN FILMS; VAPOR DEPOSITION;

SUBSTRATES;

EID: 84862142032     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4718573     Document Type: Conference Paper

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