Background-free imaging of plasmonic structures with cross-polarized apertureless scanning near-field optical microscopy

Review of Scientific Instruments

Volumn 83, Issue 3, 2012, Pages

  Esslinger, M ^a   Dorfmuller J ^a,c   Khunsin, W ^a   Vogelgesang, R ^a   Kern, K ^a,b  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b EPFL   (Switzerland)

^c UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APERTURELESS SCANNING; BACKGROUND SIGNALS; CROSS-POLARIZED; EIGEN MODES; EXPERIMENTAL TECHNIQUES; P-POLARIZED; PHASE SINGULARITIES; PLASMONIC; S-POLARIZED; SHAPE VARIATIONS; SINGULAR CONFIGURATIONS; TOPOLOGICAL FEATURES;

ANGLE MEASUREMENT; OPTICAL INSTRUMENTS; PLASMONS;

SCANNING;

EID: 84861637827     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3693346     Document Type: Review

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