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Volumn 24, Issue 10, 2012, Pages 1854-1863

Sb and Se substitution in CsBi 4Te 6: The semiconductors CsM 4Q 6 (M = Bi, Sb; Q = Te, Se), Cs 2Bi 10Q 15, and CsBi 5Q 8

Author keywords

chalcogenide; crystal growth; electronic materials; homologous series; narrow bandgap semiconductors

Indexed keywords

ADJUSTABLE PARAMETERS; CRYSTALLOGRAPHIC SITES; ELECTRICAL CONDUCTIVITY; ELECTRONIC MATERIALS; HOMOLOGOUS SERIES; INTERLAYER SPACES; LOW TEMPERATURE REGIONS; METALLIC BEHAVIORS; NARROW BAND GAP; P-TYPE CONDUCTION; PARENT COMPOUNDS; ROOM TEMPERATURE; SITE PREFERENCES; STRUCTURAL MOTIFS; THERMOELECTRIC APPLICATION; TRANSPORT BEHAVIOR;

EID: 84861366668     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm300490v     Document Type: Article
Times cited : (28)

References (28)
  • 3
    • 77956663752 scopus 로고    scopus 로고
    • Book Series: Semiconductors and Semimetals; Academic Press: San Diego, CA, Vol.
    • Kanatzidis, M. G. Recent Trends in Thermoelectric Materials Research I; Book Series: Semiconductors and Semimetals; Academic Press: San Diego, CA, 2001; Vol. 69, p 51.
    • (2001) Recent Trends in Thermoelectric Materials Research i , vol.69 , pp. 51
    • Kanatzidis, M.G.1
  • 19
    • 84861369401 scopus 로고
    • Siemens Analytical Xray Systems, Inc.: Madison, WI 53719 USA
    • SMART; Siemens Analytical Xray Systems, Inc.: Madison, WI 53719 USA, 1994.
    • (1994) SMART
  • 20
    • 84861350444 scopus 로고
    • Siemens Analytical Xray Systems, Inc. Madison, WI 53719 USA
    • SAINT, Ver. 4; Siemens Analytical Xray Systems, Inc.: Madison, WI 53719 USA, 1994-1996.
    • (1994) SAINT, Ver. 4
  • 21
    • 0003493382 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Systems, Inc. Madison, WI 53719 USA.
    • SADABS: Area-Detector Absorption Correction; Siemens Analytical X-ray Systems, Inc.: Madison, WI 53719 USA, 1996.
    • (1996) SADABS: Area-detector Absorption Correction
  • 22
    • 0004150157 scopus 로고
    • Siemens Analytical X-ray Systems, Inc. Madison, WI 53719 USA.
    • Sheldrick, G. M. SHELXTL, Ver. 5; Siemens Analytical X-ray Systems, Inc.: Madison, WI 53719 USA, 1994.
    • (1994) SHELXTL, Ver. 5
    • Sheldrick, G.M.1
  • 25
    • 0034734339 scopus 로고    scopus 로고
    • Redox-Induced "zipper" Action in the Solid State. Unprecedented Single-Crystal to Single-Crystal to Single-Crystal Cascade Conversions in Cs3Bi7Se12. Framework Evolution from 2D to 2D to 3D
    • Iordanidis, L.; Kanatzidis, M. G. Redox-Induced "Zipper" Action in the Solid State. Unprecedented Single-Crystal to Single-Crystal to Single-Crystal Cascade Conversions in Cs3Bi7Se12. Framework Evolution from 2D to 2D to 3D J. Am. Chem. Soc. 2000, 122, 8319-8320
    • (2000) J. Am. Chem. Soc. , vol.122 , pp. 8319-8320
    • Iordanidis, L.1    Kanatzidis, M.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.