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Volumn 100, Issue 3, 2006, Pages

Lorentz microscopy studies of domain wall trap structures

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; GEOMETRY; MICROSCOPIC EXAMINATION; NUCLEATION; STRUCTURAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33747509944     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2227263     Document Type: Article
Times cited : (24)

References (18)
  • 8
    • 0742322231 scopus 로고    scopus 로고
    • M. Kläui et al., Physica B 343, 343 (2004).
    • (2004) Physica B , vol.343 , pp. 343
    • Kläui, M.1
  • 15
    • 33747466166 scopus 로고    scopus 로고
    • M. J. Donahue and D. G. Porter, Report No. NISTIR 6376 (National Institute of Standards and Technology, Gaithersburg, MD, 1999)
    • M. J. Donahue and D. G. Porter, Report No. NISTIR 6376 (National Institute of Standards and Technology, Gaithersburg, MD, 1999).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.