A stochastic patent citation analysis approach to assessing future technological impacts

Technological Forecasting and Social Change

Volumn 79, Issue 1, 2012, Pages 16-29

  Lee, Changyong ^a   Cho, Yangrae ^a   Seol, Hyeonju ^b   Park, Yongtae ^a  

^a Seoul National University   (South Korea)

^b Korean Air Force Academy   (South Korea)

Author keywords

Future technological impacts; Gamma gamma model; Pareto NBD model; Stochastic patent citation analysis; Technology forecasting; Technology intelligence

Indexed keywords

INFORMATION ANALYSIS; PATENTS AND INVENTIONS; STOCHASTIC SYSTEMS; TECHNOLOGICAL FORECASTING;

FUTURE TECHNOLOGICAL IMPACTS; GAMMA-GAMMA MODELS; PARETO/NBD MODEL; STOCHASTIC PATENT CITATION ANALYSIS; TECHNOLOGY FORECASTING; TECHNOLOGY INTELLIGENCE;

STOCHASTIC MODELS;

FORECASTING METHOD; MODELING; STOCHASTICITY; TECHNOLOGICAL CHANGE; TECHNOLOGY DIFFUSION;

EID: 84860920042     PISSN: 00401625     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.techfore.2011.06.009     Document Type: Article

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