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Volumn 65, Issue 2, 2006, Pages 121-127

Measurement of depreciation rate of technological knowledge: Technology cycle time approach

Author keywords

Depreciation rate; Patent; TCT (Technology cycle time)

Indexed keywords

DEPRECIATION; INDUSTRIAL RESEARCH; INDUSTRY; PATENTS AND INVENTIONS; TECHNOLOGY;

EID: 32644481022     PISSN: 00224456     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (30)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.