Monitoring the organic structure of technology based on the patent development paths

Technological Forecasting and Social Change

Volumn 76, Issue 6, 2009, Pages 754-768

  Choi, Changwoo ^a   Park, Yongtae ^a  

^a Seoul National University   (South Korea)

Author keywords

Patent citation network, Systematic approach; Technology development path; Technology monitoring

Indexed keywords

COMPETITIVE ADVANTAGE; COMPLEX STRUCTURE; CRITICAL ASSET; DEVELOPMENT PATH; EMPIRICAL ANALYSIS; EMPIRICAL STUDIES; HISTORY OF TECHNOLOGY; INDIVIDUAL TECHNOLOGY; ORGANIC STRUCTURES; PATENT CITATION; PATENT CITATION NETWORK, SYSTEMATIC APPROACH; TECHNOLOGY DEVELOPMENT; TECHNOLOGY DEVELOPMENT PATH; TECHNOLOGY MONITORING; TECHNOLOGY-BASED;

COMPETITION; FLASH MEMORY; PATENTS AND INVENTIONS; TECHNOLOGICAL FORECASTING;

TECHNOLOGY;

ALGORITHM; COMPETITIVENESS; EMPIRICAL ANALYSIS; INTELLECTUAL PROPERTY RIGHTS; MONITORING; TECHNOLOGICAL DEVELOPMENT;

EID: 67349228395     PISSN: 00401625     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.techfore.2008.10.007     Document Type: Article

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