On the measurement of patent stock as knowledge indicators

Technological Forecasting and Social Change

Volumn 73, Issue 7, 2006, Pages 793-812

  Park, Gwangman ^a   Park, Yongtae ^b  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

Citation based; Indicator; Measurement; Patent stock; Technological knowledge; Valuation based

Indexed keywords

CALCULATIONS; INDICATORS (INSTRUMENTS);

TECHNOLOGICAL KNOWLEDGE (TK); VALUATION-BASED PATENT STOCK (VPS);

PATENTS AND INVENTIONS;

DATABASE; EMPIRICAL ANALYSIS; INTELLECTUAL PROPERTY RIGHTS; MEASUREMENT METHOD;

EID: 33746351470     PISSN: 00401625     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.techfore.2005.09.006     Document Type: Article

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