Monitoring trends of technological changes based on the dynamic patent lattice: A modified formal concept analysis approach

Technological Forecasting and Social Change

Volumn 78, Issue 4, 2011, Pages 690-702

  Lee, Changyong ^a   Jeon, Jeonghwan ^a   Park, Yongtae ^a  

^a Seoul National University   (South Korea)

Author keywords

Dynamic patent lattice; Formal concept analysis; Patent analysis; Technology intelligence; Technology monitoring

Indexed keywords

DOMAIN EXPERTS; FORMAL CONCEPT ANALYSIS; LASER TECHNOLOGIES; LATTICE THEORIES; MATHEMATICAL TOOLS; PATENT ANALYSIS; PATENT CITATION; PATENT CITATION ANALYSIS; SEMICONDUCTOR MANUFACTURING; TECHNOLOGICAL CHANGE; TECHNOLOGICAL INNOVATION; TECHNOLOGY INTELLIGENCE; TECHNOLOGY MONITORING; TEXT MINING TECHNIQUES; TIME LAG; TIME-PERIODS;

INFORMATION ANALYSIS; INNOVATION; MANUFACTURE; SEMICONDUCTOR DEVICE MANUFACTURE; TECHNOLOGY; VISUALIZATION;

PATENTS AND INVENTIONS;

ALGORITHM; COMPUTER SIMULATION; CONCEPTUAL FRAMEWORK; INNOVATION; LASER; NUMERICAL MODEL; SEMICONDUCTOR INDUSTRY; TECHNOLOGICAL CHANGE; TREND ANALYSIS;

EID: 79952700328     PISSN: 00401625     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.techfore.2010.11.010     Document Type: Article

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