Correlation lengths, porosity and water adsorption in TiO 2 thin films prepared by glancing angle deposition

Nanotechnology

Volumn 23, Issue 20, 2012, Pages

  González García, Lola ^a   Parra Barranco, Julián ^a   Sánchez Valencia, Juan R ^a   Barranco, Angel ^a   Borrás, Ana ^a   González Elipe, Agustín R ^a   García Gutiérrez, Mari Cruz ^b   Hernández, Jaime J ^b   Rueda, Daniel R ^b   Ezquerra, Tiberio A ^b  

^a UNIVERSITY OF SEVILLE   (Spain)

^b INSTITUTO DE ESTRUCTURA DE LA MATERIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI REFLECTIVE COATINGS; BASIC ELEMENTS; CORRELATION DISTANCE; CORRELATION LENGTHS; CRITICAL DIMENSION; DEPOSITION ANGLE; GLANCING ANGLE; GLANCING ANGLE DEPOSITION; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; MICRO-STRUCTURAL CHARACTERIZATION; NANO-COLUMNS; TIO; WATER ADSORPTION;

ADSORPTION; ATOMIC FORCE MICROSCOPY; DEPOSITION; OPTICAL PROPERTIES; POROSITY; THIN FILMS; TITANIUM DIOXIDE;

VAPOR DEPOSITION;

NANOMATERIAL; TITANIUM; TITANIUM DIOXIDE; WATER;

ADSORPTION; ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; POROSITY; REFRACTOMETRY; STATISTICS; SURFACE PROPERTY; ULTRASTRUCTURE;

ADSORPTION; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; NANOSTRUCTURES; PARTICLE SIZE; POROSITY; REFRACTOMETRY; STATISTICS AS TOPIC; SURFACE PROPERTIES; TITANIUM; WATER;

EID: 84860516122     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/20/205701     Document Type: Article

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