On the responsivity of UV detectors based on selectively grown ZnO nanorods

IEEE Sensors Journal

Volumn 12, Issue 5, 2012, Pages 1317-1325

  Vasudevan, Arun ^a   Jung, Soyoun ^b   Ji, Taeksoo ^c  

^a University of Arkansas   (United States)

^b Samsung Mobile Display Co Ltd   (South Korea)

^c Chonnam National University   (South Korea)

Author keywords

Metal semiconductor metal UV photodetector; optical lithography; photoresponse; ZnO nanorods

Indexed keywords

CRYSTALLINITIES; INTER-DIGITATED ELECTRODES; METAL SEMICONDUCTOR METAL; PHOTORESPONSES; RESPONSIVITY; ULTRA-VIOLET; UV PHOTODETECTORS; UV WAVELENGTH; WHEATSTONE BRIDGES; ZINC OXIDE (ZNO); ZNO; ZNO NANOROD;

BRIDGE CIRCUITS; DETECTORS; ELECTRODES; METALS; NANORODS; PHOTODETECTORS; PHOTOLITHOGRAPHY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ZINC OXIDE;

EID: 84859940975     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2011.2170162     Document Type: Article

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