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Volumn 100, Issue 15, 2012, Pages

ZnO-based one diode-one resistor device structure for crossbar memory applications

Author keywords

[No Author keywords available]

Indexed keywords

CROSS-BAR MEMORIES; DEVICE STRUCTURES; MEMRISTOR; ROOM TEMPERATURE; SPUTTERING PROCESS;

EID: 84859788454     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3701722     Document Type: Article
Times cited : (71)

References (20)
  • 17
    • 84859804041 scopus 로고    scopus 로고
    • E-APPLAB-100-084215 for cycle-to-cycle and device-to-device variations
    • See supplementary material at http://dx.doi.org/10.1063/1.3701722 E-APPLAB-100-084215 for cycle-to-cycle and device-to-device variations.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.