Improved resistive switching of textured ZNO thin films grown on ru electrodes

IEEE Electron Device Letters

Volumn 32, Issue 12, 2011, Pages 1728-1730

  Liu, Zi Jheng ^a   Chou, Jen Chun ^a   Wei, Shih Yuan ^a   Gan, Jon Yiew ^a   Yew, Tri Rung ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Nonvolatile memory; Resistance random access memory; Resistive switching; ZnO

Indexed keywords

LOW OXYGEN; NARROW DISTRIBUTION; NON-VOLATILE MEMORIES; ON/OFF RATIO; PT ELECTRODE; RESET VOLTAGE; RESISTANCE RANDOM ACCESS MEMORY; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; SWITCHING PARAMETERS; ZNO; ZNO THIN FILM;

ELECTRODES; METALLIC FILMS; OPTICAL FILMS; PLATINUM; RANDOM ACCESS STORAGE; SWITCHING SYSTEMS; THIN FILMS; ZINC OXIDE;

SWITCHING;

EID: 81855194335     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2011.2167710     Document Type: Article

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