Contacts shielding in nanowire field effect transistors

Journal of Applied Physics

Volumn 111, Issue 6, 2012, Pages

  Pitanti, Alessandro ^a   Roddaro, Stefano ^a   Vitiello, Miriam S ^a,b   Tredicucci, Alessandro ^a  

^a ISTITUTO NANOSCIENZE CNR   (Italy)

^b IFAC CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE MODELS; DENSITY PROFILE; DIELECTRIC SUBSTRATES; METALLIC CONTACTS; NONLINEAR PROPERTIES; SCREENING EFFECT; SEMICONDUCTOR NANOWIRE; TRANSPORT PARAMETERS;

DIAGNOSIS; FIELD EFFECT TRANSISTORS; NANOWIRES;

TRANSISTORS;

EID: 84859524868     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3693027     Document Type: Article

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